28 static int eb = 8;  variable
29 module_param(eb, int, S_IRUGO);
30 MODULE_PARM_DESC(eb, "eraseblock number within the selected MTD device");
48 static int check = 1;
97 		addr = (loff_t)(ebnum + 1) * mtd->erasesize - pgcnt * pgsize;  in check_eraseblock()
104 		pr_err("single bit flip occurred at EB %d "  in check_eraseblock()
107 		pr_err("error %d while reading EB %d, "  in check_eraseblock()
113 		pr_err("failed to read %zd bytes from EB %d, "  in check_eraseblock()
120 		pr_err("read wrong data from EB %d\n", ebnum);  in check_eraseblock()
126 			pr_info("re-try reading data from EB %d\n",  in check_eraseblock()
151 		addr = (loff_t)(ebnum + 1) * mtd->erasesize - pgcnt * pgsize;  in write_pattern()
156 		pr_err("error %d while writing EB %d, written %zd"  in write_pattern()
187 	       ebcnt, eb, eb + ebcnt - 1, dev);  in tort_init()
200 	if (mtd->writesize == 1) {  in tort_init()
238 		if (!(i & 1)) {  in tort_init()
247 	err = mtdtest_scan_for_bad_eraseblocks(mtd, bad_ebs, eb, ebcnt);  in tort_init()
252 	while (1) {  in tort_init()
256 		err = mtdtest_erase_good_eraseblocks(mtd, bad_ebs, eb, ebcnt);  in tort_init()
262 			for (i = eb; i < eb + ebcnt; i++) {  in tort_init()
263 				if (bad_ebs[i - eb])  in tort_init()
279 		for (i = eb; i < eb + ebcnt; i++) {  in tort_init()
280 			if (bad_ebs[i - eb])  in tort_init()
282 			if ((eb + erase_cycles) & 1)  in tort_init()
297 			for (i = eb; i < eb + ebcnt; i++) {  in tort_init()
298 				if (bad_ebs[i - eb])  in tort_init()
300 				if ((eb + erase_cycles) & 1)  in tort_init()
308 					       ((eb + erase_cycles) & 1) ?  in tort_init()
319 		erase_cycles += 1;  in tort_init()
370  * Report the detailed information about how the read EB differs from what was
411 		len = ((first + bytes) | 0x7) + 1 - offset;  in report_corrupt()
435 			j1 += 1;  in print_bufs()
456 	int first = -1;  in countdiffs()
467 			bit = 1;  in countdiffs()
471 				bit <<= 1;  in countdiffs()