Searched refs:test_size (Results 1 – 5 of 5) sorted by relevance
| /kernel/linux/linux-5.10/drivers/usb/host/ |
| D | isp1362-hcd.c | 2434 int test_size = 0; in isp1362_chip_test() local
2452 offset * 2 + PTD_HEADER_SIZE, test_size); in isp1362_chip_test()
2454 PTD_HEADER_SIZE + test_size); in isp1362_chip_test()
2456 if (memcmp(ref, tst, PTD_HEADER_SIZE + test_size)) { in isp1362_chip_test()
2457 dump_data(((u8 *)ref) + offset, PTD_HEADER_SIZE + test_size); in isp1362_chip_test()
2458 dump_data((u8 *)tst, PTD_HEADER_SIZE + test_size); in isp1362_chip_test()
2461 PTD_HEADER_SIZE + test_size); in isp1362_chip_test()
2463 if (memcmp(ref, tst, PTD_HEADER_SIZE + test_size)) { in isp1362_chip_test()
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| /kernel/linux/linux-5.10/drivers/input/touchscreen/ |
| D | cyttsp4_core.h | 287 size_t test_size; member
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| D | cyttsp4_core.c | 278 si->si_ofs.test_size = si->si_ofs.pcfg_ofs - si->si_ofs.test_ofs; in cyttsp4_si_get_test_data()
280 p = krealloc(si->si_ptrs.test, si->si_ofs.test_size, GFP_KERNEL); in cyttsp4_si_get_test_data()
288 rc = cyttsp4_adap_read(cd, si->si_ofs.test_ofs, si->si_ofs.test_size, in cyttsp4_si_get_test_data()
297 (u8 *)si->si_ptrs.test, si->si_ofs.test_size, in cyttsp4_si_get_test_data()
610 si->si_ofs.test_ofs, si->si_ofs.test_size); in cyttsp4_si_put_log_data()
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| /kernel/linux/linux-5.10/arch/ia64/include/asm/ |
| D | pal.h | 1529 ia64_pal_test_proc (u64 test_addr, u64 test_size, u64 attributes, u64 *self_test_state) in ia64_pal_test_proc() argument
1532 PAL_CALL(iprv, PAL_TEST_PROC, test_addr, test_size, attributes); in ia64_pal_test_proc()
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| /kernel/linux/linux-5.10/tools/testing/selftests/bpf/prog_tests/ |
| D | btf.c | 6765 int test_size, expect_size; in do_test_dedup() local
6769 test_size = btf_type_size(test_type); in do_test_dedup()
6772 if (CHECK(test_size != expect_size, in do_test_dedup()
6774 i, test_size, expect_size)) { in do_test_dedup()
6780 test_size), in do_test_dedup()
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