HdfNfcHdiTestAdditional (reference) in projects: test

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Searched refs:HdfNfcHdiTestAdditional (Results 1 – 2 of 2) sorted by relevance

/test/xts/hats/hdf/nfc/secureElement_additional/
D	nfc_services_test.cpp	53 class HdfNfcHdiTestAdditional : public testing::Test { class 60 void HdfNfcHdiTestAdditional::SetUpTestCase() in SetUpTestCase() 65 void HdfNfcHdiTestAdditional::TearDownTestCase() {} in TearDownTestCase() 66 void HdfNfcHdiTestAdditional::SetUp() {} in SetUp() 67 void HdfNfcHdiTestAdditional::TearDown() {} in TearDown() 74 HWTEST_F(HdfNfcHdiTestAdditional, testgetAtr001, TestSize.Level1) 100 HWTEST_F(HdfNfcHdiTestAdditional, testOpenLogicalChannel001, TestSize.Level1) 128 HWTEST_F(HdfNfcHdiTestAdditional, testOpenLogicalChannel002, TestSize.Level1) 156 HWTEST_F(HdfNfcHdiTestAdditional, testOpenLogicalChannel003, TestSize.Level1) 187 HWTEST_F(HdfNfcHdiTestAdditional, testOpenLogicalChannel004, TestSize.Level1) [all …]
/test/xts/hats/hdf/nfc/hdcService_additional/
D	nfc_services_test.cpp	78 class HdfNfcHdiTestAdditional : public testing::Test { class 85 void HdfNfcHdiTestAdditional::SetUpTestCase() { mHal = INfcV1_0::Get(); } in SetUpTestCase() 86 void HdfNfcHdiTestAdditional::TearDownTestCase() {} in TearDownTestCase() 87 void HdfNfcHdiTestAdditional::SetUp() {} in SetUp() 88 void HdfNfcHdiTestAdditional::TearDown() {} in TearDown() 109 HWTEST_F(HdfNfcHdiTestAdditional, testOpen001, Function \| MediumTest \| Level2) 135 HWTEST_F(HdfNfcHdiTestAdditional, testClose001, Function \| MediumTest \| Level1) 165 HWTEST_F(HdfNfcHdiTestAdditional, testCoreInitialized001, Function \| MediumTest \| Level1) 198 HWTEST_F(HdfNfcHdiTestAdditional, testCoreInitialized002, Function \| MediumTest \| Level1) 231 HWTEST_F(HdfNfcHdiTestAdditional, testCoreInitialized003, Function \| MediumTest \| Level1) [all …]