112 class NfcHidlTest : public ::testing::VtsHalHidlTargetTestBase {  class
189 TEST_F(NfcHidlTest, OpenAndClose) {}  in TEST_F()  argument
197 TEST_F(NfcHidlTest, WriteCoreReset) {  in TEST_F()  argument
232 TEST_F(NfcHidlTest, WriteCoreResetConfigReset) {  in TEST_F()  argument
267 TEST_F(NfcHidlTest, WriteInvalidCommand) {  in TEST_F()  argument
288 TEST_F(NfcHidlTest, WriteInvalidAndThenValidCommand) {  in TEST_F()  argument
352 TEST_F(NfcHidlTest, Bandwidth) {  in TEST_F()  argument
440 TEST_F(NfcHidlTest, PowerCycle) {  in TEST_F()  argument
454 TEST_F(NfcHidlTest, PowerCycleAfterClose) {  in TEST_F()  argument
477 TEST_F(NfcHidlTest, CoreInitialized) {  in TEST_F()  argument
504 TEST_F(NfcHidlTest, ControlGranted) {  in TEST_F()  argument
513 TEST_F(NfcHidlTest, ControlGrantedAfterClose) {  in TEST_F()  argument
535 TEST_F(NfcHidlTest, PreDiscover) {  in TEST_F()  argument
544 TEST_F(NfcHidlTest, PreDiscoverAfterClose) {  in TEST_F()  argument
567 TEST_F(NfcHidlTest, CloseAfterClose) {  in TEST_F()  argument
590 TEST_F(NfcHidlTest, OpenAfterOpen) {  in TEST_F()  argument