Searched refs:test_word (Results 1 – 4 of 4) sorted by relevance
33 define <4 x i32> @test_word(<4 x i32> %a, <4 x i32> %b) {37 ; CHECK-LABEL: @test_word
111 void test_word (u16 d, u16 s);
1711 test_word(destval, *srcreg); in x86emuOp_test_word_RM_R()1731 test_word(*destreg, *srcreg); in x86emuOp_test_word_RM_R()2737 test_word(M.x86.R_AX, (u16)srcval); in x86emuOp_test_AX_IMM()4611 test_word(destval, srcval); in x86emuOp_opcF7_word_RM()4715 test_word(*destreg, srcval); in x86emuOp_opcF7_word_RM()
1803 void test_word(u16 d, u16 s) in test_word() function