Searched refs:negative_denormalized_values (Results 1 – 12 of 12) sorted by relevance
/external/FP16/test/peachpy/ |
D | alt-xmm-to-fp32-xmm-avx.cc | 78 TEST(FP16_ALT_XMM_TO_FP32_XMM, negative_denormalized_values) { in TEST() argument
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D | alt-xmm-to-fp32-ymm-avx2.cc | 78 TEST(FP16_ALT_XMM_TO_FP32_YMM, negative_denormalized_values) { in TEST() argument
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/external/FP16/test/ |
D | alt-to-fp32-psimd.cc | 114 TEST(FP16_ALT_TO_FP32_PSIMD, negative_denormalized_values) { in TEST() argument
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D | alt-to-fp32-bits.cc | 253 TEST(FP16_ALT_TO_FP32_BITS, negative_denormalized_values) { in TEST() argument
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D | alt-to-fp32x2-psimd.cc | 189 TEST(FP16_ALT_TO_FP32x2_PSIMD, negative_denormalized_values) { in TEST() argument
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D | ieee-to-fp32-psimd.cc | 281 TEST(FP16_IEEE_TO_FP32_PSIMD, negative_denormalized_values) { in TEST() argument
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D | ieee-to-fp32-bits.cc | 323 TEST(FP16_IEEE_TO_FP32_BITS, negative_denormalized_values) { in TEST() argument
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D | alt-to-fp32-value.cc | 335 TEST(FP16_ALT_TO_FP32_VALUE, negative_denormalized_values) { in TEST() argument
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D | ieee-to-fp32-value.cc | 407 TEST(FP16_IEEE_TO_FP32_VALUE, negative_denormalized_values) { in TEST() argument
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D | alt-from-fp32-value.cc | 435 TEST(FP16_ALT_FROM_FP32_VALUE, negative_denormalized_values) { in TEST() argument
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D | ieee-from-fp32-value.cc | 443 TEST(FP16_IEEE_FROM_FP32_VALUE, negative_denormalized_values) { in TEST() argument
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D | ieee-to-fp32x2-psimd.cc | 485 TEST(FP16_IEEE_TO_FP32x2_PSIMD, negative_denormalized_values) { in TEST() argument
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