71 TEST(MicrovoltInputTest, Construction) {  in TEST()  argument
78 TEST(MicrovoltInputTest, ReadMicrovoltsWithSampleAtMin) {  in TEST()  argument
91 TEST(MicrovoltInputTest, ReadMicrovoltsWithSampleAtMax) {  in TEST()  argument
104 TEST(MicrovoltInputTest, ReadMicrovoltsWithSampleAtHalf) {  in TEST()  argument
117 TEST(MicrovoltInputTest, ReadMicrovoltsWithBipolarAdcAtZero) {  in TEST()  argument
130 TEST(MicrovoltInputTest, ReadMicrovoltsWithBipolarAdcAtMin) {  in TEST()  argument
143 TEST(MicrovoltInputTest, ReadMicrovoltsWithBipolarAdcAtMax) {  in TEST()  argument
156 TEST(MicrovoltInputTest, ReadMicrovoltsWithBipolarAdcAtUpperHalf) {  in TEST()  argument
169 TEST(MicrovoltInputTest, ReadMicrovoltsWithBipolarAdcAtLowerHalf) {  in TEST()  argument
182 TEST(MicrovoltInputTest, ReadMicrovoltsWithBipolarReferenceAtZero) {  in TEST()  argument
195 TEST(MicrovoltInputTest, ReadMicrovoltsWithBipolarReferenceAtMin) {  in TEST()  argument
208 TEST(MicrovoltInputTest, ReadMicrovoltsWithBipolarReferenceAtMax) {  in TEST()  argument
221 TEST(MicrovoltInputTest, ReadMicrovoltsWithBipolarReferenceAtHalf) {  in TEST()  argument
234 TEST(MicrovoltInputTest, ReadMicrovoltsWithSampleAtMinCornerCase) {  in TEST()  argument
245 TEST(MicrovoltInputTest, ReadMicrovoltsWithSampleAtMaxCornerCase) {  in TEST()  argument
256 TEST(MicrovoltInputTest, ReadMicrovoltsWithInvertedReferenceAtMax) {  in TEST()  argument
267 TEST(MicrovoltInputTest, ReadMicrovoltsWithInvertedReferenceAtMin) {  in TEST()  argument