Lines Matching refs:batch_div_8
28 TEST(F16_F32_VCVT__NEON_INT16_X8, batch_div_8) { in TEST() argument
176 TEST(F16_F32_VCVT__NEON_INT32_X8, batch_div_8) { in TEST() argument
324 TEST(F16_F32_VCVT__NEONFP16_X8, batch_div_8) { in TEST() argument
398 TEST(F16_F32_VCVT__SSE2_INT16_X8, batch_div_8) { in TEST() argument
546 TEST(F16_F32_VCVT__SSE2_INT32_X8, batch_div_8) { in TEST() argument
694 TEST(F16_F32_VCVT__SSE41_INT16_X8, batch_div_8) { in TEST() argument
842 TEST(F16_F32_VCVT__SSE41_INT32_X8, batch_div_8) { in TEST() argument
990 TEST(F16_F32_VCVT__AVX_INT16_X8, batch_div_8) { in TEST() argument
1138 TEST(F16_F32_VCVT__AVX_INT32_X8, batch_div_8) { in TEST() argument
1286 TEST(F16_F32_VCVT__F16C_X8, batch_div_8) { in TEST() argument
1433 TEST(F16_F32_VCVT__WASMSIMD_INT16_X8, batch_div_8) { in TEST() argument
1565 TEST(F16_F32_VCVT__WASMSIMD_INT32_X8, batch_div_8) { in TEST() argument