/ndk/tests/device/fenv/jni/ |
D | test_fenv.c | 26 #define ASSERT_EQ(x, y) \ macro 74 ASSERT_EQ(expectation2, x); in TestRounding() 85 ASSERT_EQ(FE_TONEAREST, fegetround()); in TEST() 91 ASSERT_EQ(FE_TOWARDZERO, fegetround()); in TEST() 97 ASSERT_EQ(FE_UPWARD, fegetround()); in TEST() 103 ASSERT_EQ(FE_DOWNWARD, fegetround()); in TEST() 110 ASSERT_EQ(0, fetestexcept(FE_ALL_EXCEPT)); in TEST() 125 ASSERT_EQ(0, fetestexcept(FE_ALL_EXCEPT)); in TEST()
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/ndk/sources/third_party/googletest/googletest/test/ |
D | gtest_xml_output_unittest_.cc | 55 ASSERT_EQ(1, 1); in TEST_F() 62 ASSERT_EQ(1, 2); in TEST_F() 74 ASSERT_EQ(1, 1); in TEST() 79 ASSERT_EQ(2, 3); in TEST()
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D | gtest-unittest-api_test.cc | 117 ASSERT_EQ(2 + kTypedTestCases, unit_test->total_test_case_count()); in TEST() 156 ASSERT_EQ(4, test_case->total_test_count()); in TEST() 196 ASSERT_EQ(1, test_case->total_test_count()); in TEST() 219 ASSERT_EQ(1, test_case->total_test_count()); in TEST() 245 ASSERT_EQ(2 + kTypedTestCases, unit_test->total_test_case_count()); in TearDown() 253 ASSERT_EQ(4, test_cases[0]->total_test_count()); in TearDown() 263 ASSERT_EQ(1, test_cases[1]->total_test_count()); in TearDown() 272 ASSERT_EQ(1, test_cases[2]->total_test_count()); in TearDown()
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D | gtest-linked_ptr_test.cc | 83 ASSERT_EQ(a0.get(), static_cast<A*>(NULL)); in TEST_F() 84 ASSERT_EQ(a1.get(), static_cast<A*>(NULL)); in TEST_F() 85 ASSERT_EQ(a2.get(), static_cast<A*>(NULL)); in TEST_F()
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D | gtest_unittest.cc | 1424 ASSERT_EQ(0, r0->total_part_count()); in TEST_F() 1425 ASSERT_EQ(1, r1->total_part_count()); in TEST_F() 1426 ASSERT_EQ(2, r2->total_part_count()); in TEST_F() 1457 ASSERT_EQ(0, test_result.test_property_count()); in TEST() 1465 ASSERT_EQ(1, test_result.test_property_count()); in TEST() 1478 ASSERT_EQ(2, test_result.test_property_count()); in TEST() 1500 ASSERT_EQ(2, test_result.test_property_count()); in TEST() 1948 ASSERT_EQ(0, test_result.test_property_count()) << "Property for key '" << key in ExpectNonFatalFailureRecordingPropertyWithReservedKey() 1998 ASSERT_EQ(1, test_case->ad_hoc_test_result().test_property_count()); in SetUpTestCase() 2010 ASSERT_EQ(1, unit_test_.ad_hoc_test_result().test_property_count()); in TEST_F() [all …]
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D | gtest-port_test.cc | 325 ASSERT_EQ(0, pthread_attr_init(&attr)); in TEST() 326 ASSERT_EQ(0, pthread_attr_setdetachstate(&attr, PTHREAD_CREATE_JOINABLE)); in TEST() 329 ASSERT_EQ(0, pthread_attr_destroy(&attr)); in TEST() 330 ASSERT_EQ(0, status); in TEST() 335 ASSERT_EQ(0, pthread_join(thread_id, &dummy)); in TEST() 1186 ASSERT_EQ(1U, g_destroyed.size()); in TEST() 1191 ASSERT_EQ(2U, g_destroyed.size()); in TEST() 1199 ASSERT_EQ(2U, g_destroyed.size()); in TEST() 1215 ASSERT_EQ(1U, g_destroyed.size()); in TEST() 1225 ASSERT_EQ(2U, g_destroyed.size()); in TEST() [all …]
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D | gtest-death-test_test.cc | 388 ASSERT_EQ(0, setitimer(ITIMER_PROF, &timer, NULL)); in SetSigprofActionAndTimer() 394 ASSERT_EQ(0, sigaction(SIGPROF, &signal_action, NULL)); in SetSigprofActionAndTimer() 403 ASSERT_EQ(0, setitimer(ITIMER_PROF, &timer, NULL)); in DisableSigprofActionAndTimer() 408 ASSERT_EQ(0, sigaction(SIGPROF, &signal_action, old_signal_action)); in DisableSigprofActionAndTimer() 484 ASSERT_EQ(0, pthread_atfork(&SetPthreadFlag, NULL, NULL)); in TEST_F() 1008 ASSERT_EQ(1, factory_->PassedCalls()); in TEST_F() 1023 ASSERT_EQ(1, factory_->PassedCalls()); in TEST_F() 1061 ASSERT_EQ(2, factory_->AbortCalls()); in TEST_F()
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D | gtest_output_test_.cc | 67 ASSERT_EQ(1, x); in TestEq1() 165 ASSERT_EQ(2, n); in SubWithoutTrace() 674 ASSERT_EQ(1, global_integer) << "Expected fatal failure."; in TEST() 684 ASSERT_EQ(0, n) << "Expected fatal failure."; in TEST()
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D | gtest-printers_test.cc | 859 ASSERT_EQ(expected_pattern.length(), result.length()); in TEST() 1543 ASSERT_EQ(1u, result.size()); in TEST() 1549 ASSERT_EQ(2u, result.size()); in TEST() 1558 ASSERT_EQ(2u, result.size()); in TEST()
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/ndk/sources/android/support/tests/ |
D | wchar_unittest.cc | 27 ASSERT_EQ(sizeof(__WCHAR_TYPE__), sizeof(wchar_t)); in TEST() 28 ASSERT_EQ(sizeof(int), sizeof(wint_t)); in TEST() 31 ASSERT_EQ(wchar_t(0), WCHAR_MIN); in TEST() 32 ASSERT_EQ(wchar_t(0xffffffff), WCHAR_MAX); in TEST() 35 ASSERT_EQ(wchar_t(0x80000000), WCHAR_MIN); in TEST() 36 ASSERT_EQ(wchar_t(0x7fffffff), WCHAR_MAX); in TEST()
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/ndk/sources/third_party/googletest/googletest/samples/ |
D | sample3_unittest.cc | 102 ASSERT_EQ(q->Size(), new_q->Size()); in MapTester()
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/ndk/sources/android/support/tests/minitest/ |
D | minitest.h | 470 #define ASSERT_EQ(expected, expression) \
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/ndk/sources/third_party/googletest/googletest/include/gtest/ |
D | gtest.h | 1980 # define ASSERT_EQ(val1, val2) GTEST_ASSERT_EQ(val1, val2) macro
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