Searched refs:WeaverTest (Results 1 – 2 of 2) sorted by relevance
| /external/nos/test/system-test-harness/src/ |
| D | weaver_tests.cc | 24 class WeaverTest: public testing::Test { class
61 std::random_device WeaverTest::random_number_generator;
65 uint32_t WeaverTest::slot = WeaverTest::random_number_generator() & SLOT_MASK;
67 unique_ptr<nos::NuggetClientInterface> WeaverTest::client;
68 unique_ptr<test_harness::TestHarness> WeaverTest::uart_printer;
70 void WeaverTest::SetUpTestCase() { in SetUpTestCase()
78 void WeaverTest::TearDownTestCase() { in TearDownTestCase()
85 void WeaverTest::testWrite(const string& msg, uint32_t slot, const uint8_t *key, in testWrite()
97 void WeaverTest::testRead(const string& msg, uint32_t slot, const uint8_t *key, in testRead()
115 void WeaverTest::testEraseValue(const string& msg, uint32_t slot) { in testEraseValue()
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| /external/libese/apps/weaver/tests/ |
| D | weaver_test.cpp | 30 struct WeaverTest : public ::testing::Test { struct
56 TEST_F(WeaverTest, getNumSlots) { in TEST_F() argument
62 TEST_F(WeaverTest, writeAndReadWithCorrectKey) { in TEST_F() argument
72 TEST_F(WeaverTest, writeAndReadWithIncorrectKey) { in TEST_F() argument
84 TEST_F(WeaverTest, writeAndEraseValue) { in TEST_F() argument
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