| /arch/sparc/lib/ |
| D | bitops.S | 57 .globl test_and_change_bit symbol
58 .type test_and_change_bit,#function
59 test_and_change_bit: /* %o0=nr, %o1=addr */ label
78 .size test_and_change_bit, .-test_and_change_bit
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| D | ksyms.c | 158 EXPORT_SYMBOL(test_and_change_bit);
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| /arch/cris/include/asm/ |
| D | bitops.h | 62 #define change_bit(nr, addr) (void)test_and_change_bit(nr, addr)
127 static inline int test_and_change_bit(int nr, volatile unsigned long *addr) in test_and_change_bit() function
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| /arch/mn10300/lib/ |
| D | bitops.c | 37 int test_and_change_bit(int nr, volatile void *addr) in test_and_change_bit() function
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| /arch/arm/include/asm/ |
| D | bitops.h | 209 #define test_and_change_bit(nr,p) ATOMIC_BITOP_LE(test_and_change_bit,nr,p) macro
227 #define test_and_change_bit(nr,p) ATOMIC_BITOP_BE(test_and_change_bit,nr,p) macro
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| /arch/mn10300/kernel/ |
| D | mn10300_ksyms.c | 19 EXPORT_SYMBOL(test_and_change_bit);
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| /arch/ia64/include/asm/ |
| D | sync_bitops.h | 40 return test_and_change_bit(nr, addr); in sync_test_and_change_bit()
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| D | bitops.h | 304 test_and_change_bit (int nr, volatile void *addr) in test_and_change_bit() function
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| /arch/sparc/include/asm/ |
| D | bitops_64.h | 19 extern int test_and_change_bit(unsigned long nr, volatile unsigned long *addr);
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| D | bitops_32.h | 71 static inline int test_and_change_bit(unsigned long nr, volatile unsigned long *addr) in test_and_change_bit() function
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| /arch/blackfin/include/asm/ |
| D | bitops.h | 76 static inline int test_and_change_bit(int nr, volatile unsigned long *addr) in test_and_change_bit() function
154 static inline int test_and_change_bit(int nr, volatile unsigned long *addr) in test_and_change_bit() function
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| /arch/sh/include/asm/ |
| D | bitops-grb.h | 139 static inline int test_and_change_bit(int nr, volatile void * addr) in test_and_change_bit() function
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| D | bitops-llsc.h | 118 static inline int test_and_change_bit(int nr, volatile void * addr) in test_and_change_bit() function
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| /arch/m68k/include/asm/ |
| D | bitops_no.h | 151 static __inline__ int test_and_change_bit(int nr, volatile unsigned long * addr) in test_and_change_bit() function
170 #define __test_and_change_bit(nr, addr) test_and_change_bit(nr, addr)
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| D | bitops_mm.h | 126 #define test_and_change_bit(nr,vaddr) \ macro
131 #define __test_and_change_bit(nr,vaddr) test_and_change_bit(nr,vaddr)
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| /arch/avr32/include/asm/ |
| D | bitops.h | 218 static inline int test_and_change_bit(int nr, volatile void * addr) in test_and_change_bit() function
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| /arch/parisc/include/asm/ |
| D | bitops.h | 100 static __inline__ int test_and_change_bit(int nr, volatile unsigned long * addr) in test_and_change_bit() function
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| /arch/h8300/include/asm/ |
| D | bitops.h | 178 H8300_GEN_TEST_BITOP(test_and_change_bit,"bnot")
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| /arch/x86/include/asm/ |
| D | bitops.h | 298 static inline int test_and_change_bit(int nr, volatile unsigned long *addr) in test_and_change_bit() function
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| /arch/s390/include/asm/ |
| D | bitops.h | 406 #define test_and_change_bit test_and_change_bit_cs macro
413 #define test_and_change_bit test_and_change_bit_simple macro
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| /arch/alpha/include/asm/ |
| D | bitops.h | 247 test_and_change_bit(unsigned long nr, volatile void * addr) in test_and_change_bit() function
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| /arch/powerpc/include/asm/ |
| D | bitops.h | 193 static __inline__ int test_and_change_bit(unsigned long nr, in test_and_change_bit() function
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| /arch/mips/include/asm/ |
| D | bitops.h | 482 static inline int test_and_change_bit(unsigned long nr, in test_and_change_bit() function
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