| /arch/hexagon/include/asm/ |
| D | bitops.h | 95 static inline int test_and_change_bit(int nr, volatile void *addr) in test_and_change_bit() function
132 test_and_change_bit(nr, addr); in change_bit()
156 test_and_change_bit(nr, addr); in __change_bit()
172 return test_and_change_bit(nr, addr); in __test_and_change_bit()
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| /arch/mn10300/lib/ |
| D | bitops.c | 36 int test_and_change_bit(unsigned long nr, volatile void *addr) in test_and_change_bit() function
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| /arch/sparc/include/asm/ |
| D | bitops_64.h | 20 int test_and_change_bit(unsigned long nr, volatile unsigned long *addr);
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| D | bitops_32.h | 71 static inline int test_and_change_bit(unsigned long nr, volatile unsigned long *addr) in test_and_change_bit() function
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| /arch/arm64/include/asm/ |
| D | bitops.h | 34 extern int test_and_change_bit(int nr, volatile unsigned long *p);
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| D | sync_bitops.h | 22 #define sync_test_and_change_bit(nr, p) test_and_change_bit(nr, p)
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| /arch/mn10300/kernel/ |
| D | mn10300_ksyms.c | 19 EXPORT_SYMBOL(test_and_change_bit);
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| /arch/m68k/include/asm/ |
| D | bitops.h | 295 #define test_and_change_bit(nr, vaddr) bchg_reg_test_and_change_bit(nr, vaddr) macro
297 #define test_and_change_bit(nr, vaddr) bchg_mem_test_and_change_bit(nr, vaddr) macro
299 #define test_and_change_bit(nr, vaddr) (__builtin_constant_p(nr) ? \ macro
304 #define __test_and_change_bit(nr, vaddr) test_and_change_bit(nr, vaddr)
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| /arch/arm64/kernel/ |
| D | arm64ksyms.c | 67 EXPORT_SYMBOL(test_and_change_bit);
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| /arch/frv/include/asm/ |
| D | bitops.h | 46 static inline int test_and_change_bit(unsigned long nr, volatile void *addr) in test_and_change_bit() function
66 test_and_change_bit(nr, addr); in change_bit()
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| /arch/tile/include/asm/ |
| D | bitops_32.h | 115 static inline int test_and_change_bit(unsigned nr, in test_and_change_bit() function
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| D | bitops_64.h | 79 static inline int test_and_change_bit(unsigned nr, in test_and_change_bit() function
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| /arch/arm64/lib/ |
| D | bitops.S | 74 testop test_and_change_bit, eor, ldeoral
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| /arch/sparc/lib/ |
| D | bitops.S | 54 ENTRY(test_and_change_bit) /* %o0=nr, %o1=addr */
73 ENDPROC(test_and_change_bit)
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| D | ksyms.c | 127 EXPORT_SYMBOL(test_and_change_bit);
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| /arch/sh/include/asm/ |
| D | bitops-llsc.h | 118 static inline int test_and_change_bit(int nr, volatile void *addr) in test_and_change_bit() function
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| D | bitops-grb.h | 139 static inline int test_and_change_bit(int nr, volatile void * addr) in test_and_change_bit() function
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| /arch/metag/include/asm/ |
| D | bitops.h | 90 static inline int test_and_change_bit(unsigned int bit, in test_and_change_bit() function
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| /arch/blackfin/include/asm/ |
| D | bitops.h | 94 static inline int test_and_change_bit(int nr, volatile unsigned long *addr) in test_and_change_bit() function
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| /arch/arm/include/asm/ |
| D | bitops.h | 193 #define test_and_change_bit(nr,p) ATOMIC_BITOP(test_and_change_bit,nr,p) macro
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| /arch/xtensa/include/asm/ |
| D | bitops.h | 200 test_and_change_bit(unsigned int bit, volatile unsigned long *p) in test_and_change_bit() function
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| /arch/h8300/include/asm/ |
| D | bitops.h | 153 H8300_GEN_TEST_BITOP(test_and_change_bit, "bnot")
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| /arch/mn10300/include/asm/ |
| D | bitops.h | 149 extern int test_and_change_bit(unsigned long nr, volatile void *addr);
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| /arch/m32r/include/asm/ |
| D | bitops.h | 222 static __inline__ int test_and_change_bit(int nr, volatile void * addr) in test_and_change_bit() function
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| /arch/parisc/include/asm/ |
| D | bitops.h | 104 static __inline__ int test_and_change_bit(int nr, volatile unsigned long * addr) in test_and_change_bit() function
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