| /drivers/net/ethernet/sfc/ |
| D | selftest.c | 99 static int efx_test_phy_alive(struct efx_nic *efx, struct efx_self_tests *tests) in efx_test_phy_alive() argument
105 tests->phy_alive = rc ? -1 : 1; in efx_test_phy_alive()
111 static int efx_test_nvram(struct efx_nic *efx, struct efx_self_tests *tests) in efx_test_nvram() argument
120 tests->nvram = rc ? -1 : 1; in efx_test_nvram()
134 struct efx_self_tests *tests) in efx_test_interrupts() argument
140 tests->interrupt = -1; in efx_test_interrupts()
162 tests->interrupt = 1; in efx_test_interrupts()
168 struct efx_self_tests *tests) in efx_test_eventq_irq() argument
216 tests->eventq_dma[channel->channel] = dma_seen ? 1 : -1; in efx_test_eventq_irq()
217 tests->eventq_int[channel->channel] = int_seen ? 1 : -1; in efx_test_eventq_irq()
[all …]
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| D | ethtool.c | 303 struct efx_self_tests *tests, in efx_ethtool_fill_self_tests() argument
310 efx_fill_test(n++, strings, data, &tests->phy_alive, in efx_ethtool_fill_self_tests()
312 efx_fill_test(n++, strings, data, &tests->nvram, in efx_ethtool_fill_self_tests()
314 efx_fill_test(n++, strings, data, &tests->interrupt, in efx_ethtool_fill_self_tests()
320 &tests->eventq_dma[channel->channel], in efx_ethtool_fill_self_tests()
324 &tests->eventq_int[channel->channel], in efx_ethtool_fill_self_tests()
329 efx_fill_test(n++, strings, data, &tests->memory, in efx_ethtool_fill_self_tests()
331 efx_fill_test(n++, strings, data, &tests->registers, in efx_ethtool_fill_self_tests()
345 efx_fill_test(n++, strings, data, &tests->phy_ext[i], in efx_ethtool_fill_self_tests()
355 &tests->loopback[mode], mode, n, in efx_ethtool_fill_self_tests()
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| D | selftest.h | 49 int efx_selftest(struct efx_nic *efx, struct efx_self_tests *tests,
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| D | siena.c | 95 static int siena_test_chip(struct efx_nic *efx, struct efx_self_tests *tests) in siena_test_chip() argument
109 tests->registers = in siena_test_chip()
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| D | net_driver.h | 1256 int (*test_chip)(struct efx_nic *efx, struct efx_self_tests *tests);
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| D | falcon.c | 1894 falcon_b0_test_chip(struct efx_nic *efx, struct efx_self_tests *tests) in falcon_b0_test_chip() argument
1913 tests->registers = in falcon_b0_test_chip()
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| D | ef10.c | 4393 efx_ef10_test_chip(struct efx_nic *efx, struct efx_self_tests *tests) in efx_ef10_test_chip() argument
4404 tests->memory = efx_ef10_run_bist(efx, MC_CMD_MC_MEM_BIST) ? -1 : 1; in efx_ef10_test_chip()
4405 tests->registers = efx_ef10_run_bist(efx, MC_CMD_REG_BIST) ? -1 : 1; in efx_ef10_test_chip()
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| /drivers/of/unittest-data/ |
| D | testcases.dts | 12 #include "tests-phandle.dtsi"
13 #include "tests-interrupts.dtsi"
14 #include "tests-match.dtsi"
15 #include "tests-platform.dtsi"
16 #include "tests-overlay.dtsi"
28 phandle-tests {
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| D | tests-platform.dtsi | 4 platform-tests {
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| D | tests-phandle.dtsi | 11 phandle-tests {
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| /drivers/gpu/drm/nouveau/ |
| D | Kbuild | 8 #- code also used by various userspace tools/tests
13 #- code also used by various userspace tools/tests
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| /drivers/mmc/card/ |
| D | Kconfig | 65 in host controllers. The tests are executed by writing to the
67 on your card will be overwritten by these tests.
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| /drivers/mtd/ |
| D | Kconfig | 16 tristate "MTD tests support (DANGEROUS)"
19 This option includes various MTD tests into compilation. The tests
23 WARNING: some of the tests will ERASE entire MTD device which they
24 test. Do not use these tests unless you really know what you do.
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| D | Makefile | 33 obj-y += chips/ lpddr/ maps/ devices/ nand/ onenand/ tests/
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| /drivers/staging/media/mn88472/ |
| D | TODO | 14 checkpatch.pl tests. I don't want waste my time to review this kind of
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| /drivers/staging/media/mn88473/ |
| D | TODO | 14 checkpatch.pl tests. I don't want waste my time to review this kind of
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| /drivers/staging/media/davinci_vpfe/ |
| D | TODO | 21 layer and compatibility tests that warrants (using the libv4l's LD_PRELOAD
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| /drivers/of/ |
| D | Kconfig | 15 bool "Device Tree runtime unit tests"
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| /drivers/cpufreq/ |
| D | Kconfig.arm | 166 tests but not documented in any datasheet.
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| /drivers/iommu/ |
| D | Kconfig | 37 Enable self-tests for LPAE page table allocator. This performs
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| /drivers/usb/gadget/ |
| D | Kconfig | 374 and its driver through a basic set of functional tests.
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| /drivers/usb/gadget/legacy/ |
| D | Kconfig | 32 and its driver through a basic set of functional tests.
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| /drivers/usb/host/ |
| D | Kconfig | 785 to include other tests that require support from a HCD driver.
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| /drivers/ide/ |
| D | Kconfig | 363 onboard chipsets. It also tests for Simplex mode and enables
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