Searched full:bad (Results 1 – 25 of 185) sorted by relevance
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| /Documentation/admin-guide/device-mapper/ |
| D | dm-dust.rst | 4 This target emulates the behavior of bad sectors at arbitrary
11 drive with bad sectors).
15 in the "bad block list" will fail with EIO ("Input/output error").
17 Writes of blocks in the "bad block list will result in the following:
19 1. Remove the block from the "bad block list".
22 This emulates the "remapped sector" behavior of a drive with bad
25 Normally, a drive that is encountering bad sectors will most likely
26 encounter more bad sectors, at an unknown time or location.
28 messages to add arbitrary bad blocks at new locations, and the
30 configured "bad blocks" will be treated as bad, or bypassed.
[all …]
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| /Documentation/driver-api/ |
| D | mtdnand.rst | 424 use bad block tables on FLASH, because the ECC layout is interfering
425 with the bad block marker positions. See bad block table support for
428 Bad block table support
431 Most NAND chips mark the bad blocks at a defined position in the spare
432 area. Those blocks must not be erased under any circumstances as the bad
433 block information would be lost. It is possible to check the bad block
435 the first page in the block. This is time consuming so a bad block table
438 The nand driver supports various types of bad block tables.
442 The bad block table contains all bad block information of the device
447 A bad block table is used per chip and contains the bad block
[all …]
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| /Documentation/translations/zh_CN/admin-guide/ |
| D | bug-bisect.rst | 45 $ git bisect bad [commit]
58 $ git bisect bad
66 $ git bisect bad # Current version is bad
71 ``git bisect start [BAD] [GOOD]``
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| /Documentation/translations/zh_TW/admin-guide/ |
| D | bug-bisect.rst | 48 $ git bisect bad [commit]
61 $ git bisect bad
69 $ git bisect bad # Current version is bad
74 ``git bisect start [BAD] [GOOD]``
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| /Documentation/arch/arm/ |
| D | mem_alignment.rst | 8 bad idea to configure it out, but Russell King has some good reasons for
13 Of course this is a bad idea to rely on the alignment trap to perform
20 trap to SIGBUS any code performing unaligned access (good for debugging bad
27 real bad - it changes the behaviour of all unaligned instructions in user
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| /Documentation/devicetree/bindings/hwmon/ |
| D | adi,ltc4282.yaml | 43 adi,fet-bad-timeout-ms:
45 From the moment a FET bad conditions is present, this property selects the
46 wait time/timeout for a FET-bad fault to be signaled. Setting this to 0,
47 disables FET bad faults to be reported.
111 good (PULL the pin low when power is not good) or that power is bad (Go
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| /Documentation/hwmon/ |
| D | ltc4282.rst | 52 Also clears fet bad and short fault logs.
56 in0_fault Failure in the MOSFETs. Either bad or shorted FET.
101 Also clears power bad fault logs.
127 power1_bad_fault_log Set to 1 by a power1 bad fault occurring.
129 in0_fet_bad_fault_log Set to 1 when a FET-BAD fault occurs.
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| D | ltc4215.rst | 58 power1_alarm power bad alarm
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| /Documentation/translations/zh_CN/doc-guide/ |
| D | contributing.rst | 47 ./drivers/devfreq/devfreq.c:1818: warning: bad line:
49 ./drivers/devfreq/devfreq.c:1854: warning: bad line:
75 ./drivers/devfreq/devfreq.c:1818: warning: bad line:
77 ./drivers/devfreq/devfreq.c:1854: warning: bad line:
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| /Documentation/filesystems/ |
| D | ubifs.rst | 33 5 Eraseblocks may become bad (only on NAND flashes) and software should
34 deal with this. Blocks on hard drives typically do not become bad,
35 because hardware has mechanisms to substitute bad blocks, at least in
47 limitations like wear and bad blocks (items 4 and 5 in the above list).
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| /Documentation/admin-guide/ |
| D | bug-bisect.rst | 32 you consider to be working and broken, which Git calls 'good' and 'bad'::
36 git bisect bad v6.1
59 git bisect bad
71 is the first bad commit', then you have finished the bisection. In that case
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| /Documentation/devicetree/bindings/mtd/ |
| D | davinci-nand.txt | 52 - nand-on-flash-bbt: use flash based bad block table support. OOB
66 - ti,davinci-nand-use-bbt: use flash based bad block table support. OOB
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| D | raw-nand-chip.yaml | 61 With this property, the OS will search the device for a Bad
66 find Bad Block Markers (BBM). These markers will help to
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| D | gpmi-nand.yaml | 76 Don't swap the bad block marker from the OOB area with the byte in
77 the data area but rely on the flash based BBT for identifying bad blocks.
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| /Documentation/translations/zh_CN/core-api/ |
| D | kref.rst | 144 /* BAD BAD BAD - 在交接后得到 */
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| /Documentation/ABI/testing/ |
| D | sysfs-fs-ubifs | 33 with a bad crc checksum.
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| D | sysfs-bus-pci-devices-aer_stats | 24 Bad TLP 0
25 Bad DLLP 0
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| D | sysfs-memory-page-offline | 11 on the bad page list and never be reused.
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| D | sysfs-class-mtd | 149 marked as bad.
215 The number of blocks marked as bad, if any, in this partition.
224 bad block table (BBT).
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| /Documentation/gpu/amdgpu/display/ |
| D | index.rst | 37 in the series is enough to point to a bad change, and two possible actions
38 emerge: fix the issue or drop the patch. If it is not an easy fix, the bad
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| /Documentation/core-api/ |
| D | kref.rst | 143 /* BAD BAD BAD - get is after the handoff */
151 bad style. Don't do it.
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| /Documentation/devicetree/bindings/net/ |
| D | maxlinear,gpy2xx.yaml | 22 interrupt line which is usually bad for shared lines. By default,
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| /Documentation/ABI/stable/ |
| D | sysfs-class-ubi | 47 Count of bad physical eraseblocks on the underlying MTD device.
108 Number of physical eraseblocks reserved for bad block handling.
124 Total number of good (not marked as bad) physical eraseblocks on
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| D | vdso | 17 within their rights to crash.) In addition, if you pass a bad
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| /Documentation/usb/ |
| D | dwc3.rst | 14 until the command completes which is bad.
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